JPS5577188U - - Google Patents
Info
- Publication number
- JPS5577188U JPS5577188U JP15981278U JP15981278U JPS5577188U JP S5577188 U JPS5577188 U JP S5577188U JP 15981278 U JP15981278 U JP 15981278U JP 15981278 U JP15981278 U JP 15981278U JP S5577188 U JPS5577188 U JP S5577188U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1978159812U JPH0216295Y2 (en]) | 1978-11-20 | 1978-11-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1978159812U JPH0216295Y2 (en]) | 1978-11-20 | 1978-11-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5577188U true JPS5577188U (en]) | 1980-05-28 |
JPH0216295Y2 JPH0216295Y2 (en]) | 1990-05-02 |
Family
ID=29152967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1978159812U Expired JPH0216295Y2 (en]) | 1978-11-20 | 1978-11-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0216295Y2 (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008032740A (ja) * | 2007-09-21 | 2008-02-14 | Advantest Corp | 電子部品試験装置および電子部品の試験方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5123469U (en]) * | 1974-08-09 | 1976-02-20 |
-
1978
- 1978-11-20 JP JP1978159812U patent/JPH0216295Y2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5123469U (en]) * | 1974-08-09 | 1976-02-20 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008032740A (ja) * | 2007-09-21 | 2008-02-14 | Advantest Corp | 電子部品試験装置および電子部品の試験方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0216295Y2 (en]) | 1990-05-02 |