JPS5577188U - - Google Patents

Info

Publication number
JPS5577188U
JPS5577188U JP15981278U JP15981278U JPS5577188U JP S5577188 U JPS5577188 U JP S5577188U JP 15981278 U JP15981278 U JP 15981278U JP 15981278 U JP15981278 U JP 15981278U JP S5577188 U JPS5577188 U JP S5577188U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15981278U
Other languages
Japanese (ja)
Other versions
JPH0216295Y2 (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1978159812U priority Critical patent/JPH0216295Y2/ja
Publication of JPS5577188U publication Critical patent/JPS5577188U/ja
Application granted granted Critical
Publication of JPH0216295Y2 publication Critical patent/JPH0216295Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1978159812U 1978-11-20 1978-11-20 Expired JPH0216295Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1978159812U JPH0216295Y2 (en]) 1978-11-20 1978-11-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1978159812U JPH0216295Y2 (en]) 1978-11-20 1978-11-20

Publications (2)

Publication Number Publication Date
JPS5577188U true JPS5577188U (en]) 1980-05-28
JPH0216295Y2 JPH0216295Y2 (en]) 1990-05-02

Family

ID=29152967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1978159812U Expired JPH0216295Y2 (en]) 1978-11-20 1978-11-20

Country Status (1)

Country Link
JP (1) JPH0216295Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008032740A (ja) * 2007-09-21 2008-02-14 Advantest Corp 電子部品試験装置および電子部品の試験方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5123469U (en]) * 1974-08-09 1976-02-20

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5123469U (en]) * 1974-08-09 1976-02-20

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008032740A (ja) * 2007-09-21 2008-02-14 Advantest Corp 電子部品試験装置および電子部品の試験方法

Also Published As

Publication number Publication date
JPH0216295Y2 (en]) 1990-05-02

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